Field-emission scanning electron microscope with analytical detectors
Field-Emission Scanning Electron Microscope (FE-SEM) with Brand Name Only Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software — Solicitation b7ba6671e17a49348ac3480a1990027d, issued by Federal (Maryland place-of-performance).
In plain English
NIST is procuring a field-emission SEM equipped with EBSD and EDS detectors plus analytical software for materials characterization research in Gaithersburg, Maryland. This is a brand-name equipment solicitation for the National Institute of Standards and Technology's laboratory operations.
Key facts
- Issuing agency
- Federal (Maryland place-of-performance)
- Solicitation number
- b7ba6671e17a49348ac3480a1990027d
- Type
- Combined Synopsis/Solicitation
- Posted
- Sep 1, 2026
- Response deadline
- Sep 15, 2026, 9:00 AM EDT
- Place of performance
- Gaithersburg, MD, 20899
Official description
Solicitation #1333ND26QNB640581. Issued by COMMERCE, DEPARTMENT OF › NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY › DEPT OF COMMERCE NIST. NAICS 334516. Product/Service Code 6640. Place of performance: Gaithersburg, MD, 20899.
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