Custom diffractometry and Fourier ptychography endstation
CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation — Solicitation 9b9e94a42c8740b4b791604324b9ab72, issued by Federal (Maryland place-of-performance).
In plain English
NIST seeks a specialized scientific instrument combining custom diffractometry and Fourier ptychography capabilities for advanced chip research and development. The endstation will be installed at NIST's Gaithersburg, Maryland facility and supports the federal CHIPS R&D initiative. Proposals were due September 9, 2026.
Key facts
- Issuing agency
- Federal (Maryland place-of-performance)
- Solicitation number
- 9b9e94a42c8740b4b791604324b9ab72
- Type
- Combined Synopsis/Solicitation
- Posted
- Aug 28, 2026
- Response deadline
- Sep 9, 2026, 11:00 AM EDT
- Place of performance
- Gaithersburg, MD, 20899
Official description
Solicitation #1333ND26QNB030236. Issued by COMMERCE, DEPARTMENT OF › NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY › DEPT OF COMMERCE NIST. NAICS 334519. Product/Service Code 6640. Place of performance: Gaithersburg, MD, 20899.
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